The table below lists the test modules executed for the SBBR recipe.
Note: X[sbbr] indicates that the FWTS test X belongs to the SBBR test category (executed as part of the
--sbbrtest-list).
| Test | Minor Tests |
|---|---|
| acpi_sbbr[sbbr] | 1. Test that processors only exist in the _SB namespace |
| 2. Test DSDT and SSDT tables are implemented | |
| 3. Check for mandatory and recommended ACPI tables | |
| 4. Check the existence of SPCR console devices | |
| acpitables[sbbr] | 1. Test ACPI headers |
| 2. Test ACPI spec versus table revisions | |
| aest | 1. Validate AEST table |
| bert | 1. BERT Boot Error Record Table test |
| bgrt | 1. BGRT Boot Graphics Resource Table test |
| cedt | 1. Validate CEDT table |
| dbg2[sbbr] | 1. DBG2 (Debug Port Table 2) test |
| 2. DBG2 ARM BSA compliant UART test | |
| dmicheck[sbbr] | 1. Find and test SMBIOS Table Entry Points |
| 2. Test DMI/SMBIOS tables for errors | |
| 3. Test DMI/SMBIOS3 tables for errors | |
| 4. Test ARM SBBR SMBIOS structure requirements | |
| einj | 1. EINJ Error Injection Table test |
| erst | 1. ERST Error Record Serialization Table test |
| esrt[sbbr] | 1. Sanity check UEFI ESRT Table |
| fadt_sbbr[sbbr] | 1. FADT Revision Test |
| 2. FADT Reduced HW Test | |
| 3. FADT PSCI Compliant Test | |
| gtdt[sbbr] | 1. GTDT Generic Timer Description Table test |
| hest | 1. HEST Hardware Error Source Table test |
| hmat | 1. Validate HMAT table |
| ibft | 1. Validate iBFT table |
| iort | 1. IORT IO Remapping Table test |
| madt[sbbr] | 1. MADT checksum test |
| 2. MADT revision test | |
| 3. MADT architecture minimum revision test | |
| 4. MADT flags field reserved bits test | |
| 5. MADT subtable tests | |
| mcfg[sbbr] | 1. Validate MCFG table |
| 2. Validate MCFG PCI config space | |
| method[sbbr] | 1. Test Method Names |
| 2. Test _PR (Processor) | |
| 3. Test _Wxx (Wake Event) | |
| 4. Test _AEI | |
| 5. Test _EVT (Event Method) | |
| 6. Test _DLM (Device Lock Mutex) | |
| 7. Test _GL (Global Lock) | |
| 8. Test _OS (Operating System) | |
| 9. Test _REV (Revision) | |
| 10. Test _PIC (Inform AML of Interrupt Model) | |
| 11. Test _CID (Compatible ID) | |
| 12. Test _CLS (Class Code) | |
| 13. Test _DDN (DOS Device Name) | |
| 14. Test _HID (Hardware ID) | |
| 15. Test _HRV (Hardware Revision Number) | |
| 16. Test _MLS (Multiple Language String) | |
| 17. Test _PLD (Physical Device Location) | |
| 18. Test _SUB (Subsystem ID) | |
| 19. Test _SUN (Slot User Number) | |
| 20. Test _STR (String) | |
| 21. Test _UID (Unique ID) | |
| 22. Test _CDM (Clock Domain) | |
| 23. Test _VDM (Voltage Domain) | |
| 24. Test _CRS (Current Resource Settings) | |
| 25. Test _DSD (Device Specific Data) | |
| 26. Test _DIS (Disable) | |
| 27. Test _DMA (Direct Memory Access) | |
| 28. Test _FIX (Fixed Register Resource Provider) | |
| 29. Test _GSB (Global System Interrupt Base) | |
| 30. Test _HPP (Hot Plug Parameters) | |
| 31. Test _HPX (Hot Plug Extensions) | |
| 32. Test _MAT (Multiple APIC Table Entry) | |
| 33. Test _PRS (Possible Resource Settings) | |
| 34. Test _PRT (PCI Routing Table) | |
| 35. Test _PXM (Proximity) | |
| 36. Test _SLI (System Locality Information) | |
| 37. Test _SRS (Set Resource Settings) | |
| 38. Test _CCA (Cache Coherency Attribute) | |
| 39. Test _EDL (Eject Device List) | |
| 40. Test _EJD (Ejection Dependent Device) | |
| 41. Test _EJ0 (Eject) | |
| 42. Test _EJ1 (Eject) | |
| 43. Test _EJ2 (Eject) | |
| 44. Test _EJ3 (Eject) | |
| 45. Test _EJ4 (Eject) | |
| 46. Test _LCK (Lock) | |
| 47. Test _OST (OSPM Status Indication) | |
| 48. Test _RMV (Remove) | |
| 49. Test _STA (Status) | |
| 50. Test _DEP (Operational Region Dependencies) | |
| 51. Test _FIT (Firmware Interface Table) | |
| 52. Test _BDN (BIOS Dock Name) | |
| 53. Test _BBN (Base Bus Number) | |
| 54. Test _DCK (Dock) | |
| 55. Test _INI (Initialize) | |
| 56. Test _GLK (Global Lock) | |
| 57. Test _REG (Region) | |
| 58. Test _SEG (Segment) | |
| 59. Test _LSI (Label Storage Information) | |
| 60. Test _CBR (CXL Host Bridge Register) | |
| 61. Test _OFF (Set resource off) | |
| 62. Test _ON_ (Set resource on) | |
| 63. Test _DSW (Device Sleep Wake) | |
| 64. Test _IRC (In Rush Current) | |
| 65. Test _PRE (Power Resources for Enumeration) | |
| 66. Test _PR0 (Power Resources for D0) | |
| 67. Test _PR1 (Power Resources for D1) | |
| 68. Test _PR2 (Power Resources for D2) | |
| 69. Test _PR3 (Power Resources for D3) | |
| 70. Test _PRW (Power Resources for Wake) | |
| 71. Test _PS0 (Power State 0) | |
| 72. Test _PS1 (Power State 1) | |
| 73. Test _PS2 (Power State 2) | |
| 74. Test _PS3 (Power State 3) | |
| 75. Test _PSC (Power State Current) | |
| 76. Test _PSE (Power State for Enumeration) | |
| 77. Test _PSW (Power State Wake) | |
| 78. Test _S1D (S1 Device State) | |
| 79. Test _S2D (S2 Device State) | |
| 80. Test _S3D (S3 Device State) | |
| 81. Test _S4D (S4 Device State) | |
| 82. Test _S0W (S0 Device Wake State) | |
| 83. Test _S1W (S1 Device Wake State) | |
| 84. Test _S2W (S2 Device Wake State) | |
| 85. Test _S3W (S3 Device Wake State) | |
| 86. Test _S4W (S4 Device Wake State) | |
| 87. Test _RST (Device Reset) | |
| 88. Test _PRR (Power Resource for Reset) | |
| 89. Test _DSC (Deepest State for Configuration) | |
| 90. Test _S0_ (S0 System State) | |
| 91. Test _S1_ (S1 System State) | |
| 92. Test _S2_ (S2 System State) | |
| 93. Test _S3_ (S3 System State) | |
| 94. Test _S4_ (S4 System State) | |
| 95. Test _S5_ (S5 System State) | |
| 96. Test _SWS (System Wake Source) | |
| 97. Test _PSS (Performance Supported States) | |
| 98. Test _CPC (Continuous Performance Control) | |
| 99. Test _CSD (C State Dependencies) | |
| 100. Test _CST (C States) | |
| 101. Test _PCT (Performance Control) | |
| 102. Test _PDC (Processor Driver Capabilities) | |
| 103. Test _PDL (P-State Depth Limit) | |
| 104. Test _PPC (Performance Present Capabilities) | |
| 105. Test _PPE (Polling for Platform Error) | |
| 106. Test _PSD (Power State Dependencies) | |
| 107. Test _PTC (Processor Throttling Control) | |
| 108. Test _TDL (T-State Depth Limit) | |
| 109. Test _TPC (Throttling Present Capabilities) | |
| 110. Test _TSD (Throttling State Dependencies) | |
| 111. Test _TSS (Throttling Supported States) | |
| 112. Test _LPI (Low Power Idle States) | |
| 113. Test _RDI (Resource Dependencies for Idle) | |
| 114. Test _PUR (Processor Utilization Request) | |
| 115. Test _MSG (Message) | |
| 116. Test _SST (System Status) | |
| 117. Test _ALC (Ambient Light Colour Chromaticity) | |
| 118. Test _ALI (Ambient Light Illuminance) | |
| 119. Test _ALT (Ambient Light Temperature) | |
| 120. Test _ALP (Ambient Light Polling) | |
| 121. Test _ALR (Ambient Light Response) | |
| 122. Test _LID (Lid Status) | |
| 123. Test _GTF (Get Task File) | |
| 124. Test _GTM (Get Timing Mode) | |
| 125. Test _SDD (Set Device Data) | |
| 126. Test _STM (Set Timing Mode) | |
| 127. Test _FDE (Floppy Disk Enumerate) | |
| 128. Test _FDI (Floppy Drive Information) | |
| 129. Test _FDM (Floppy Drive Mode) | |
| 130. Test _MBM (Memory Bandwidth Monitoring Data) | |
| 131. Test _MSM (Memory Set Monitoring) | |
| 132. Test _UPC (USB Port Capabilities) | |
| 133. Test _PDO (USB Power Data Object) | |
| 134. Test _DSM (Device Specific Method) | |
| 135. Test _UPD (User Presence Detect) | |
| 136. Test _UPP (User Presence Polling) | |
| 137. Test _GCP (Get Capabilities) | |
| 138. Test _GRT (Get Real Time) | |
| 139. Test _GWS (Get Wake Status) | |
| 140. Test _CWS (Clear Wake Status) | |
| 141. Test _SRT (Set Real Time) | |
| 142. Test _STP (Set Expired Timer Wake Policy) | |
| 143. Test _STV (Set Timer Value) | |
| 144. Test _TIP (Expired Timer Wake Policy) | |
| 145. Test _TIV (Timer Values) | |
| 146. Test _NBS (NVDIMM Boot Status) | |
| 147. Test _NCH (NVDIMM Current Health Information) | |
| 148. Test _NIC (NVDIMM Health Error Injection Capabilities) | |
| 149. Test _NIH (NVDIMM Inject/Clear Health Errors) | |
| 150. Test _NIG (NVDIMM Inject Health Error Status) | |
| 151. Test _SBS (Smart Battery Subsystem) | |
| 152. Test _BCT (Battery Charge Time) | |
| 153. Test _BIF (Battery Information) | |
| 154. Test _BIX (Battery Information Extended) | |
| 155. Test _BMA (Battery Measurement Averaging) | |
| 156. Test _BMC (Battery Maintenance Control) | |
| 157. Test _BMD (Battery Maintenance Data) | |
| 158. Test _BMS (Battery Measurement Sampling Time) | |
| 159. Test _BPC (Battery Power Characteristics) | |
| 160. Test _BPS (Battery Power State) | |
| 161. Test _BPT (Battery Power Threshold) | |
| 162. Test _BST (Battery Status) | |
| 163. Test _BTP (Battery Trip Point) | |
| 164. Test _BTH (Battery Throttle Limit) | |
| 165. Test _BTM (Battery Time) | |
| 166. Test _BLT (Battery Level Threshold) | |
| 167. Test _PCL (Power Consumer List) | |
| 168. Test _PCS (Power Source Current Status) | |
| 169. Test _PIF (Power Source Information) | |
| 170. Test _PRL (Power Source Redundancy List) | |
| 171. Test _PSR (Power Source) | |
| 172. Test _PST (Power Status Threshold) | |
| 173. Test _GAI (Get Averaging Level) | |
| 174. Test _GHL (Get Hardware Limit) | |
| 175. Test _PAI (Power Averaging Interval) | |
| 176. Test _PMC (Power Meter Capabilities) | |
| 177. Test _PMD (Power Meter Devices) | |
| 178. Test _PMM (Power Meter Measurement) | |
| 179. Test _PTP (Power Trip Points) | |
| 180. Test _SHL (Set Hardware Limit) | |
| 181. Test _WPC (Wireless Power Calibration) | |
| 182. Test _WPP (Wireless Power Polling) | |
| 183. Test _FIF (Fan Information) | |
| 184. Test _FPS (Fan Performance States) | |
| 185. Test _FSL (Fan Set Level) | |
| 186. Test _FST (Fan Status) | |
| 187. Test _ACx (Active Cooling) | |
| 188. Test _ART (Active Cooling Relationship Table) | |
| 189. Test _ALx (Active List) | |
| 190. Test _CRT (Critical Trip Point) | |
| 191. Test _CR3 (Warm/Standby Temperature) | |
| 192. Test _DTI (Device Temperature Indication) | |
| 193. Test _HOT (Hot Temperature) | |
| 194. Test _MTL (Minimum Throttle Limit) | |
| 195. Test _NTT (Notification Temp Threshold) | |
| 196. Test _PSL (Passive List) | |
| 197. Test _PSV (Passive Temp) | |
| 198. Test _RTV (Relative Temp Values) | |
| 199. Test _SCP (Set Cooling Policy) | |
| 200. Test _TC1 (Thermal Constant 1) | |
| 201. Test _TC2 (Thermal Constant 2) | |
| 202. Test _TFP (Thermal fast Sampling Period) | |
| 203. Test _TMP (Thermal Zone Current Temp) | |
| 204. Test _TPT (Trip Point Temperature) | |
| 205. Test _TRT (Thermal Relationship Table) | |
| 206. Test _TSN (Thermal Sensor Device) | |
| 207. Test _TSP (Thermal Sampling Period) | |
| 208. Test _TST (Temperature Sensor Threshold) | |
| 209. Test _TZD (Thermal Zone Devices) | |
| 210. Test _TZM (Thermal Zone member) | |
| 211. Test _TZP (Thermal Zone Polling) | |
| 212. Test _GPE (General Purpose Events) | |
| 213. Test _EC_ (EC Offset Query) | |
| 214. Test _PTS (Prepare to Sleep) | |
| 215. Test _TTS (Transition to State) | |
| 216. Test _WAK (System Wake) | |
| 217. Test _ADR (Return Unique ID for Device) | |
| 218. Test _BCL (Query List of Brightness Control Levels Supported) | |
| 219. Test _BCM (Set Brightness Level) | |
| 220. Test _BQC (Brightness Query Current Level) | |
| 221. Test _DCS (Return the Status of Output Device) | |
| 222. Test _DDC (Return the EDID for this Device) | |
| 223. Test _DSS (Device Set State) | |
| 224. Test _DGS (Query Graphics State) | |
| 225. Test _DOD (Enumerate All Devices Attached to Display Adapter) | |
| 226. Test _DOS (Enable/Disable Output Switching) | |
| 227. Test _GPD (Get POST Device) | |
| 228. Test _ROM (Get ROM Data) | |
| 229. Test _SPD (Set POST Device) | |
| 230. Test _VPO (Video POST Options) | |
| 231. Test _CBA (Configuration Base Address) | |
| 232. Test _IFT (IPMI Interface Type) | |
| 233. Test _SRV (IPMI Interface Revision) | |
| mpam | 1. Validate MPAM table |
| nfit | 1. Validate NFIT table |
| pcct | 1. Validate PCC table |
| pdtt | 1. Validate PDTT table |
| pptt[sbbr] | 1. Validate PPTT table |
| ras2 | 1. Validate RAS2 table |
| rsdp_sbbr[sbbr] | 1. RSDP Root System Description Pointer test |
| sdei | 1. Validate SDEI table |
| slit | 1. SLIT System Locality Distance Information test |
| smccc | 1. Test PCI_VERSION |
| 2. Test PCI_FEATURES | |
| 3. Test PCI_GET_SEG_INFO | |
| 4. Test ARM_SMCCC_VERSION | |
| 5. Test ARM_SMCCC_ARCH_FEATURES | |
| 6. Test ARM_SMCCC_ARCH_SOC_ID for Soc_ID_type 0 | |
| 7. Test ARM_SMCCC_ARCH_SOC_ID for Soc_ID_type 1 | |
| spcr[sbbr] | 1. SPCR Serial Port Console Redirection Table test |
| 2. SPCR Revision Test | |
| 3. SPCR GSIV Interrupt Test | |
| srat | 1. SRAT System Resource Affinity Table test |
| uefibootpath[sbbr] | 1. Test UEFI Boot Path Boot#### |
| uefirtmisc[sbbr] | 1. Test for UEFI miscellaneous runtime service interfaces |
| 2. Stress test for UEFI miscellaneous runtime service interfaces | |
| 3. Test GetNextHighMonotonicCount with invalid NULL parameter | |
| 4. Test UEFI miscellaneous runtime services unsupported status | |
| uefirttime[sbbr] | 1. Test UEFI RT service get time interface |
| 2. Test UEFI RT service get time interface, NULL time parameter | |
| 3. Test UEFI RT service get time interface, NULL time and NULL capabilities parameters | |
| 4. Test UEFI RT service set time interface | |
| 5. Test UEFI RT service set time interface, invalid year 1899 | |
| 6. Test UEFI RT service set time interface, invalid year 10000 | |
| 7. Test UEFI RT service set time interface, invalid month 0 | |
| 8. Test UEFI RT service set time interface, invalid month 13 | |
| 9. Test UEFI RT service set time interface, invalid day 0 | |
| 10. Test UEFI RT service set time interface, invalid day 32 | |
| 11. Test UEFI RT service set time interface, invalid hour 24 | |
| 12. Test UEFI RT service set time interface, invalid minute 60 | |
| 13. Test UEFI RT service set time interface, invalid second 60 | |
| 14. Test UEFI RT service set time interface, invalid nanosecond 1000000000 | |
| 15. Test UEFI RT service set time interface, invalid timezone -1441 | |
| 16. Test UEFI RT service set time interface, invalid timezone 1441 | |
| 17. Test UEFI RT service set time interface, invalid daylight 0xfc | |
| 18. Test UEFI RT service get wakeup time interface | |
| 19. Test UEFI RT service get wakeup time interface, NULL enabled parameter | |
| 20. Test UEFI RT service get wakeup time interface, NULL pending parameter | |
| 21. Test UEFI RT service get wakeup time interface, NULL time parameter | |
| 22. Test UEFI RT service get wakeup time interface, NULL enabled, pending and time parameters | |
| 23. Test UEFI RT service set wakeup time interface | |
| 24. Test UEFI RT service set wakeup time interface, NULL time parameter | |
| 25. Test UEFI RT service set wakeup time interface, invalid year 1899 | |
| 26. Test UEFI RT service set wakeup time interface, invalid year 10000 | |
| 27. Test UEFI RT service set wakeup time interface, invalid month 0 | |
| 28. Test UEFI RT service set wakeup time interface, invalid month 13 | |
| 29. Test UEFI RT service set wakeup time interface, invalid day 0 | |
| 30. Test UEFI RT service set wakeup time interface, invalid day 32 | |
| 31. Test UEFI RT service set wakeup time interface, invalid hour 24 | |
| 32. Test UEFI RT service set wakeup time interface, invalid minute 60 | |
| 33. Test UEFI RT service set wakeup time interface, invalid second 60 | |
| 34. Test UEFI RT service set wakeup time interface, invalid nanosecond 1000000000 | |
| 35. Test UEFI RT service set wakeup time interface, invalid timezone -1441 | |
| 36. Test UEFI RT service set wakeup time interface, invalid timezone 1441 | |
| 37. Test UEFI RT service set wakeup time interface, invalid daylight 0xfc | |
| 38. Test UEFI RT time services unsupported status | |
| uefirtvariable[sbbr] | 1. Test UEFI RT service get variable interface |
| 2. Test UEFI RT service get next variable name interface | |
| 3. Test UEFI RT service set variable interface | |
| 4. Test UEFI RT service query variable info interface | |
| 5. Test UEFI RT service variable interface stress test | |
| 6. Test UEFI RT service set variable interface stress test | |
| 7. Test UEFI RT service query variable info interface stress test | |
| 8. Test UEFI RT service get variable interface, invalid parameters | |
| 9. Test UEFI RT variable services unsupported status | |
| xsdt[sbbr] | 1. XSDT Extended System Description Table test |