[BUG] Enterprise SSD's missing "Percentage Used" info from smartmon -a #831
Description
Describe the bug
A clear and concise description of what the bug is.
Enterprise SSD's missing "Percentage Used"
If I run smartmon -a, I receive this data (that I presume is what scrutiny pulls from)
=== START OF INFORMATION SECTION ===
Device Model: MK000960GWEZK
Serial Number: 18151BF3186B
LU WWN Device Id: 5 00a075 11bf3186b
Firmware Version: HPGE
User Capacity: 960,197,124,096 bytes [960 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
TRIM Command: Available, deterministic, zeroed
Device is: Not in smartctl database 7.3/5528
ATA Version is: ACS-3 T13/2161-D revision 5
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Tue Nov 18 15:08:53 2025 PST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 1953) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 8) minutes.
Conveyance self-test routine
recommended polling time: ( 3) minutes.
SCT capabilities: (0x0035) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
1 Raw_Read_Error_Rate 0x000f 100 100 050 Pre-fail Always - 0
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 58285
173 Unknown_Attribute 0x0033 099 099 010 Pre-fail Always - 98
175 Program_Fail_Count_Chip 0x0033 100 100 001 Pre-fail Always - 0
180 Unused_Rsvd_Blk_Cnt_Tot 0x003b 100 100 001 Pre-fail Always - 0
194 Temperature_Celsius 0x0022 063 034 000 Old_age Always - 37 (Min/Max 13/66)
196 Reallocated_Event_Count 0x0033 100 100 001 Pre-fail Always - 0
SMART Error Log not supported
SMART Self-test Log not supported
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
The above only provides legacy SMART information - try 'smartctl -x' for more
If I run smartctl -x (as is recommended in the last line of smartctl -a) I receive this data (truncated, as it is looooong)
......
128 2025-11-18 15:11 35 ****************
SCT Error Recovery Control command not supported
Device Statistics (GP Log 0x04)
Page Offset Size Value Flags Description
0x01 ===== = = === == General Statistics (rev 1) ==
0x01 0x008 4 130 --- Lifetime Power-On Resets
0x01 0x010 4 58285 --- Power-on Hours
0x01 0x018 6 261352600066 --- Logical Sectors Written
0x01 0x020 6 1599139366 --- Number of Write Commands
0x01 0x028 6 493081734291 --- Logical Sectors Read
0x01 0x030 6 1971575985 --- Number of Read Commands
0x01 0x038 6 209828247050 --- Date and Time TimeStamp
0x04 ===== = = === == General Errors Statistics (rev 1) ==
0x04 0x008 4 0 --- Number of Reported Uncorrectable Errors
0x04 0x010 4 77 --- Resets Between Cmd Acceptance and Completion
0x05 ===== = = === == Temperature Statistics (rev 1) ==
0x05 0x008 1 39 --- Current Temperature
0x05 0x010 1 33 --- Average Short Term Temperature
0x05 0x018 1 33 --- Average Long Term Temperature
0x05 0x020 1 66 --- Highest Temperature
0x05 0x028 1 13 --- Lowest Temperature
0x05 0x030 1 49 --- Highest Average Short Term Temperature
0x05 0x038 1 16 --- Lowest Average Short Term Temperature
0x05 0x040 1 33 --- Highest Average Long Term Temperature
0x05 0x048 1 16 --- Lowest Average Long Term Temperature
0x05 0x050 4 0 --- Time in Over-Temperature
0x05 0x058 1 60 --- Specified Maximum Operating Temperature
0x05 0x060 4 0 --- Time in Under-Temperature
0x05 0x068 1 0 --- Specified Minimum Operating Temperature
0x06 ===== = = === == Transport Statistics (rev 1) ==
0x06 0x008 4 894 --- Number of Hardware Resets
0x06 0x010 4 159 --- Number of ASR Events
0x06 0x018 4 0 --- Number of Interface CRC Errors
0x07 ===== = = === == Solid State Device Statistics (rev 1) ==
0x07 0x008 1 1 N-- Percentage Used Endurance Indicator
|||_ C monitored condition met
||__ D supports DSN
|___ N normalized value
Pending Defects log (GP Log 0x0c)
No Defects Logged
SATA Phy Event Counters (GP Log 0x11)
ID Size Value Description
0x0001 4 0 Command failed due to ICRC error
0x0003 4 0 R_ERR response for device-to-host data FIS
0x0004 4 0 R_ERR response for host-to-device data FIS
0x0006 4 0 R_ERR response for device-to-host non-data FIS
0x000a 4 16 Device-to-host register FISes sent due to a COMRESET
0x000b 4 0 CRC errors within host-to-device FIS
0x000d 4 0 Non-CRC errors within host-to-device FIS
It looks like Percentage Used is not present in the the legacy info, but it is present in the extended/new info:
0x07 0x008 1 1 N-- Percentage Used Endurance Indicator
is there any way for Scrutiny to poll this extended data to get Percentage Used info from enterprise drives?