Hi @adrienluitot,
I’ve received the open-source IC sample containing your 2.45 GHz LNA (130 nm) and have mounted the die in our probe station to begin characterization. Before proceeding with measurements, I would like to confirm the correct pad assignments, biasing conditions, and the intended evaluation methodology to ensure the device is tested as designed.
Could you please provide the following information?
1. Pad map / pad functions
-
A labeled diagram or screenshot of the die indicating the function of each pad.
-
Identification of:
- VDD pads
- Ground pads
- RF input and RF output pads
- Bias pads (gate bias, current bias, reference, etc.)
- Any pads that must remain floating or unused.
-
If multiple ground pads exist, whether they must all be probed or tied together externally.
2. Bias conditions
- Recommended supply voltage(s) (VDD).
- Required bias voltages or currents for any bias pads.
- Expected total current consumption at nominal operation.
- Whether any bias sequencing is required (e.g., bias before VDD).
3. RF measurement setup
- Intended frequency range and center frequency for characterization (I assume around 2.45 GHz but please confirm).
4. Target / expected performance
If available, it would help to know the expected ranges so we can confirm correct operation:
- Small-signal gain (S21)
- Input return loss (S11)
- Output return loss (S22)
- Noise figure
- Linearity metrics (e.g., IIP3/IIM3)
- Compression point (P1dB)
- Any other parameters you consider important.
5. Measurement considerations
- Maximum safe RF input power.
- Whether on-chip ESD protection is present.
- Any stability considerations or precautions during probing.
6. Documentation
If you have any of the following, they would be extremely helpful:
- Test plan or characterization notes
- Schematic or block diagram
- Layout screenshot with labeled pads
- Simulated performance plots
Once I have the pad map and bias conditions, I can proceed with the RF probing and begin the measurements.
BR Phillip
Hi @adrienluitot,
I’ve received the open-source IC sample containing your 2.45 GHz LNA (130 nm) and have mounted the die in our probe station to begin characterization. Before proceeding with measurements, I would like to confirm the correct pad assignments, biasing conditions, and the intended evaluation methodology to ensure the device is tested as designed.
Could you please provide the following information?
1. Pad map / pad functions
A labeled diagram or screenshot of the die indicating the function of each pad.
Identification of:
If multiple ground pads exist, whether they must all be probed or tied together externally.
2. Bias conditions
3. RF measurement setup
4. Target / expected performance
If available, it would help to know the expected ranges so we can confirm correct operation:
5. Measurement considerations
6. Documentation
If you have any of the following, they would be extremely helpful:
Once I have the pad map and bias conditions, I can proceed with the RF probing and begin the measurements.
BR Phillip