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./tests: Update test configuration and hil connections document.
Signed-off-by: Ramya Subramanyam <[email protected]>
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tests/cy8ckit-062s2-ai-hil-test-table.md

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@@ -31,7 +31,7 @@
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| SPI | P9_0 | P9_1 | MOSI and MISO shorted |
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| | P9_2 | NC | SCLK to SCLK |
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| | | | |
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| ADC | P10.0 | VDDA 3.3V | A0 connected to VDDA 3.3V |
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| Analog IO ADC | P10.0 | VDDA 3.3V | A0 connected to VDDA 3.3V |
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| | P10.1 | VoltageDivider | A1 connected to Voltage |
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| | | | divider circuit as below: |
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| | | | |
@@ -45,3 +45,6 @@
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| | | | | |
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| | | | GND (0V) |
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| | | | |
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| Analog IO PWM | P9.6 | P9.7 | IO6 (PWM feedback) to |
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| | | | IO7 (PWM Output) |
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| | | | |

tests/test_config.h

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#include <stdint.h>
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// Test Pin Definitions
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#define TEST_DIGITALIO_OUTPUT 7 // IO_4
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#define TEST_DIGITALIO_INPUT 6 // IO_3
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#define TEST_SYNC_INPUT_OUTPUT 4 // IO_1
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#define TEST_PIN_DIGITAL_IO_OUTPUT 7 // IO_4
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#define TEST_PIN_DIGITAL_IO_INPUT 6 // IO_3
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#define TEST_SPI_SLAVE_SELECT 3 // IO_0
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#define TEST_PIN_SYNC_IO 4 // IO_1
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#define TEST_ANALOG_IO_VREF A0 // Pin connected to VREF
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#define TEST_ANALOG_IO_DIVIDER A1 // Pin connected to voltage divider
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#define TEST_PIN_SPI_SSEL 3 // IO_0
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#define VDDA 3.3f // Assume VDDA is 3.3V
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#define RESOLUTION 2048 // 11-bit resolution
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#define TEST_PIN_ANALOG_IO_VREF A0 // Pin connected to VREF
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#define TEST_PIN_ANALOG_IO_DIVIDER A1 // Pin connected to voltage divider
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#define TEST_ADC_RESOLUTION 2048 // 11-bit resolution
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#endif // TEST_CONFIG_H

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