Improved output for multiple expected results

Author: erangell

.DS_Store

@@ -291,12 +291,12 @@ void setPinValue (String p)
 
 void passTest()
 {
-  Serial.println("PASS");
+  Serial.println(" PASS");
 }
 
 void failTest()
 {
-  Serial.println("***FAIL***");
+  Serial.println(" FAIL <<<");
 }
 
 void TestParam(String p)
@@ -417,10 +417,13 @@ void TestParam(String p)
     {
       if (tstPhase == 0)
       {
-        //Serial.println("Pin:");
-        //Serial.println(_savePinNum);
+        Serial.print(" P");
+        Serial.print(_savePinNum);
+        Serial.print("=");
+
         //Serial.println("Expect:"+p);
         int result = digitalRead(_savePinNum);
+        Serial.print(result);
         if (p[0]=='1') // expect HIGH
         {
           if (result == 1)
@@ -448,6 +451,7 @@ void TestParam(String p)
       else
       {
         _savePinNum = getPinNumFromName(p);
+        Serial.print(p+":");
       }
       break;
     }

ChipTester.ino

@@ -15,6 +15,9 @@ M,22,D0,O,24,D1,O,26,D2,I
 P,D0,0,D1,0
 ```
 
+Lines that do not begin with a valid command are ignored, so you may use
+a character like '*' to add comments to your test scripts.
+
 * M = pin mappings - sequences of 3 parameters
   * pin number
   * pin name to be used in further statements
@@ -35,12 +38,15 @@ E,D2,1
 * T = define a named test and the input conditions to be set
 * D = delay for a number of milliseconds
 * E = expected results to be verified.  In this case, the D2 pin will be checked for a logical high value.  If any condition on the expected results line fails, the test is considered failed.
-
-Note: Multiple expected results needs to be tested - see issue #1
+ Multiple expected results may be tested for each E command
 
 ## Counting Pulses
 For future development:
 * C = count pulses on specific pins during a specific delay
+* X = measure time in microseconds until expected result is achieved
+  (ex: set a pin low and measure how long it takes for an output to go high) 
+  This would need both precondition and expected result on same line
+  and would need to do all work after full line is processed and prepared.
 
 # Sample Test Run in Serial Monitor:
 ```

README.md

@@ -0,0 +1,9 @@
+* Set up pin mappings: PIN number, Pin Name, Input or Output
+M,22,D0,O,24,D1,O,26,D2,I
+M,28,D3,O,30,D4,O,32,D5,I
+M,34,D6,O,36,D7,O,38,D8,I
+M,40,D9,O,42,D10,O,44,D11,I
+* Set up initial pin values to be set before applying power
+* Note: Arduino outputs = chip inputs
+P,D0,0,D1,0,D3,0,D4,0
+P,D6,0,D7,0,D9,0,D10,0

SDCard/.DS_Store

@@ -0,0 +1,22 @@
+****************
+* NOR = Not OR *
+* 0 NOR 0 = 1  *
+* 0 NOR 1 = 0  *
+* 1 NOR 0 = 0  *
+* 1 NOR 1 = 0  *
+****************
+
+* Test all 4 NOR gates with the same values for each truth table row.
+
+T,NOR00,D0,0,D1,0,D3,0,D4,0,D6,0,D7,0,D9,0,D10,0
+D,100
+E,D2,1,D5,1,D8,1,D11,1
+T,NOR01,D0,0,D1,1,D3,0,D4,1,D6,0,D7,1,D9,0,D10,1
+D,100
+E,D2,0,D5,0,D8,0,D11,0
+T,NOR10,D0,1,D1,0,D3,1,D4,0,D6,1,D7,0,D9,1,D10,0
+D,100
+E,D2,0,D5,0,D8,0,D11,0
+T,NOR11,D0,1,D1,1,D3,1,D4,1,D6,1,D7,1,D9,1,D10,1
+D,100
+E,D2,0,D5,0,D8,0,D11,0