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\documentclass{report}
\input{preamble}
\input{macros}
\input{letterfonts}
\title{\Huge{SEDRA/SMITH}\\\huge{Microelectronic Circuits}\\\normalsize{SEVENTH EDITION}}
\author{\huge{Notes by Kevin Wang}}
\date{\today}
\begin{document}
% Seems like the next time \chapter{} gets called, it updates
\setcounter{chapter}{2}
\maketitle
\newpage% or \cleardoublepage
% \pdfbookmark[<level>]{<title>}{<dest>}
\pdfbookmark[section]{\contentsname}{toc}
\tableofcontents
\pagebreak
\chapter{Semiconductors}
\section*{Introduction}
\section{Intrinsic Semiconductors}
\section{Doped Semiconductors}
\section{Current Flow in Semiconductors}
\section{The \textit{pn} Junction with an Applied Voltage}
\subsection{Qualitative Description of Junction Operation}
\subsection{The Current-Voltage Relationship of the Junction}
\subsection{Reverse Breakdown}
\section{Capacitive Effects in the \textit{pn} Junction}
2 ways charge can be stored in \textit{pn} junction.
\begin{enumerate}
\item charge in depletion region (more visible when reverse bias)
\item minority charge in \textit{n} and \textit{p} material (more visible when forward bias)
\begin{itemize}
\item concentration profile by injecting to n-dope
\item \makebox[0pt][l]{\qquad \qquad " \qquad \qquad " \qquad}\phantom{concentration profile by injecting} to p-dope
\end{itemize}
\end{enumerate}
\subsection{Depletion or Junction Capacitance}\label{sec:3.6.1-depletion-or...}
\textbf{Assumption:} \textit{pn} junction reversed bias with $V_R$, charge on either side of junction:
\begin{equation}
Q_J = A \sqrt{2\epsilon_s q \frac{N_A N_D}{N_A + N_D} \left(V_0 + V_R\right)} = \alpha \sqrt{\left(V_0 + V_R\right)}
\label{eq:3.6-alpha-v0-vr}
\end{equation}
We denote $\alpha$ as $A \sqrt{2\epsilon_s q \frac{N_A N_D}{N_A + N_D}}$ and observe that $Q_J \not\propto V_R$ (also not linearly related)
\begin{itemize}
\item Hard to define capacitance that accounts for changing $Q_J$ when $V_R$ changes
\end{itemize}
\begin{figure}[!hbpt]
\centering
\includegraphics{figures/path172092.png}
\caption{The charge stored on either side of the depletion layer as a function of the reverse voltage $V_R$}
\label{fig:charge-volt-cap-graph}
\end{figure}
\textbf{Assumption:} junction operates as a point $Q$ and define
\begin{equation}
C_j = \frac{dQ_J}{dV_r} \bigg| _{V_R=V_Q}
\label{eq:3.6-cap-relating-charge-to-volt}
\end{equation}
\begin{note}
The definition of capacitance
\begin{equation*}
q = CV
\implies C = q/V = \frac{\Delta q}{\Delta V}
\end{equation*}
\begin{itemize}
\item Equation \ref{eq:3.6-cap-relating-charge-to-volt} useful in electronic cct design
\item This equation used in this book frequently
\item Called the \textbf{``incremental-capacitance approach''}
\end{itemize}
\end{note}
Combining equations \ref{eq:3.6-cap-relating-charge-to-volt} with \ref{eq:3.6-alpha-v0-vr} we obtain:
\begin{equation}
C_j = \frac{\alpha}{2\sqrt{V_0 + V_R}}
\label{eq:3.6-derivative-Cj}
\end{equation}
We observe that $C_j$ at reverse bias ($V_R = 0$) is $C_{j0} = \frac{\alpha}{2\sqrt{V_0}}$, so we can write $C_j$ as
\begin{equation}
C_j = \frac{C_{j0}}{\sqrt{1+\frac{V_R}{V_0}}}
\label{eq:3.6-cj-wrt-cj0}
\end{equation}
Substituting for $\alpha$, we obtain:
\begin{equation}
C_j = A \sqrt{\left(
\frac{\epsilon_s q}{2}
\right)\left(
\frac{N_A N_D}{N_A + N_D}
\right)\left(
\frac{1}{V_0}
\right)}
\label{eq:3.6-cj-wrt-cj0-alpha-sub}
\end{equation}
Before leaving concept of junction capacitance, we introduce
\dfn{Terms}{
\textbf{Abrupt junction}: \textit{pn} junction, doping concentration changes abruptly at junction boundary (this is deliberately done) \\
\textbf{Graded junction}: \textit{pn} junction, carrier concentration changes gradually from one side to another.
}
If graded junction, then $C_j$ becomes:
\begin{equation*}
C_j = \frac{C_{j0}}{\left(1+\frac{V_R}{V_0}\right)^m}
\end{equation*}
where $m$ is the \textbf{Grading coefficient}
\begin{itemize}
\item $m$ ranges from 1/3 to 1/2
\item $m$ depends on manner in which concentration changes from \textit{p} to \textit{n} side
\end{itemize}
\qs{Exercise 3.14}{
For the \textit{pn} \dots cm$^2$. \\
\sol{Solution}
}
\subsection{Diffusion Capacitance}
\textbf{Consider:} \textit{pn} junction, forward bias: \\
\textbf{Assume:} in steady state
\begin{itemize}
\item Minority-carrier distributions in \textit{p} and \textit{n} regions as shown in \textlangle Fig. 3.12\textrangle
\begin{itemize}
\item Some minority charge carrier charges stored in \textit{p} and \textit{n} regions outside depletion region
\end{itemize}
\item Changes in terminal voltage cause charges as mentioned $\uparrow$$\uparrow$ to change before new steady state
\end{itemize}
\textit{This}, completely different charge-storage phenomenon than \ref{sec:3.6.1-depletion-or...}
\begin{itemize}
\item Previous section was charge-storage of non-depletion region
\item This section is charge-storage of depletion region
\end{itemize}
We calculate excess minority-carrier charge \textlangle Fig. 3.12\textrangle by taking shaded area under exponential
\textbf{Consider:} excess hole charges in \textit{n} region $Q_p$
\begin{align}
Q_p &= Aq \times \text{shaded area under the $p_n(x)$ curve}\notag \\
&= Aq \left[p_n(x_n) - p_{n0}\right]L_p \label{eq:3.6-area-under-curve-charge}
\end{align}
\begin{note}
Recall area under exponential curve $Ae^{-x/B}$ is equal to AB
\end{note}
Doing some substitutions \textlangle add sections\textrangle to Eq. (\ref{eq:3.6-area-under-curve-charge}):
\begin{equation}
Q_p = \frac{L_p^2}{D_p}I_p
\end{equation}
We note that the factor $\frac{L_p^2}{D_p}$ relates $Q_p$ to $I_p$ is very useful parameter, and has dimensions of time (s). Thus we denote:
\begin{equation}
\tau_p = \frac{L_p^2}{D_p}
\end{equation}
So:
\begin{equation}
Q_p = \tau_p I_p \label{eq:3.6-qptpip}
\end{equation}
\dfn{Terms}{
\textbf{Minority-carrier (hole) lifetime}: Average time it takes for a hole injected into the n region to recombine with a majority electron, denoted $\tau_p$ \\
}
This definition has the following implications:
\begin{itemize}
\item Entire charge, $Q_p$ disappears
\item $Q_p$ has to be replenished every $\tau_p$ seconds
\item The current responsible for replenishing is $I_p$
\end{itemize}
Similarly for electrons charge in \textit{p} region:
\begin{equation}
Q_n = \tau_n I_n \label{eq:3.6-qntnin}
\end{equation}
Where $\tau_n$ is electron lifespan in \textit{p} region. Thus, the total excess minority-carrier charge:
\begin{equation}
Q = \tau_p I_p + \tau_n I_n
\label{eq:3.6-qtpiptnin}
\end{equation}
In terms of $I = I_p + I_n$, the diode current
\begin{equation}
Q = \tau_T I
\end{equation}
\dfn{Term}{
\textbf{Mean transit time}: For the junction, is equal to $\tau_T$ \\
}
We recognize that one side of junction more heavily doped than another. If $N_A >> N_D$:
\begin{itemize}
\item $I_p$~\textgreater{}\textgreater~$I_n$
\item $I \approx I_p$
\item $Q_p$~\textgreater{}\textgreater~$Q_n$
\item $Q \approx Q_p$
\item \fbox{$\tau_T \approx \tau_p$}
\end{itemize}
\dfn{Term}{
\textbf{Incremental diffusion capacitance}: Defined $C_d$, for small changes around a bias point:
\begin{equation}
C_d = \frac{dQ}{dV} = \left(\frac{\tau_T}{V_T}\right) I
\end{equation}
Where $I$ is the forward-bias current \\
}
Note:
\begin{itemize}
\item $C_d \propto I$
\begin{itemize}
\item Because of this, $C_d$ negligibly small when reverse bias
\end{itemize}
\item To keep $C_d$ small, transit time must be small
\begin{itemize}
\item Important requirement for \textit{pn} junction for high-speed or high-frequency
\end{itemize}
\end{itemize}
\qs{Exercise 3.15}{
Use the definition \dots
\sol{Solution}
}
\qs{Exercise 3.16}{
For the \textit{pn} \dots
\sol{Solution}
}
\chapter{Diodes}
\section*{Introduction}
\section{The Ideal Diode}
\subsection{Current-Voltage Characteristic}
\begin{itemize}
\item Diodes are the most simple and fundamental non-linear CCT
\item Similar to resistor: 2 terminals
\item Dissimilar to resistor: nonlinear $i-v$
\end{itemize}
\noindent Roadmap:
\begin{enumerate}
\item Ideal diode
\item Silicon junction diode
\begin{enumerate}
\item Terminal characteristics
\item Analysis diode CCT
\end{enumerate}
\item Device modelling
\item Rectifiers
\item Photodiodes and LEDs
\item \fbox{Diode is nothing more than a \textit{pn}-junction}
\end{enumerate}
\section{The Ideal Diode}
\begin{figure}
\centering
\begin{subfigure}{0.4\textwidth}
\centering
\includegraphics[width=\textwidth]{figures/fig4.1a.png}
\caption{~}
\end{subfigure}
\begin{subfigure}{0.4\textwidth}
\centering
\includegraphics[width=\textwidth]{figures/fig4.1a.png}
\caption{~}
\end{subfigure} \\
\begin{subfigure}{0.4\textwidth}
\centering
\includegraphics[width=\textwidth]{figures/fig4.1a.png}
\caption{~}
\end{subfigure}
\begin{subfigure}{0.4\textwidth}
\centering
\includegraphics[width=\textwidth]{figures/fig4.1a.png}
\caption{~}
\end{subfigure}
\end{figure}
\end{document}