[sw/silicon_creator] Use EXPECT_DEATH in unit tests

Fixes lowRISC#10549

Signed-off-by: Alphan Ulusoy <[email protected]>

Author: alphan

sw/device/silicon_creator/lib/base/sec_mmio_unittest.cc

@@ -173,54 +173,53 @@ TEST_F(SecMmioTest, CheckCount) {
   EXPECT_EQ(ctx_->check_count, 2);
 }
 
-// Negative test cases trigger assertions, which are caugth by `ASSERT_DEATH`
-// calls. All test cases use lambda functions to wrap expectations and work
-// around issue google/googletest#1004.
+// Negative test cases trigger assertions, which are caugth by `EXPECT_DEATH`
+// calls.
 class SecMmioDeathTest : public SecMmioTest {};
 
 TEST_F(SecMmioDeathTest, Read32OrDieSimulatedFault) {
-  ASSERT_DEATH(
-      [] {
+  EXPECT_DEATH(
+      {
         EXPECT_ABS_READ32(0, 0x12345678);
         EXPECT_ABS_READ32(0, 0);
         sec_mmio_read32(0);
-      }(),
+      },
       "");
 }
 
 TEST_F(SecMmioDeathTest, Write32SimulatedFault) {
-  ASSERT_DEATH(
-      [] {
+  EXPECT_DEATH(
+      {
         EXPECT_ABS_WRITE32(0, 0x12345678);
         EXPECT_ABS_READ32(0, 0);
         sec_mmio_write32(0, 0x12345678);
-      }(),
+      },
       "");
 }
 
 TEST_F(SecMmioDeathTest, CheckValuesSimulatedFault) {
-  ASSERT_DEATH(
-      [] {
+  EXPECT_DEATH(
+      {
         EXPECT_ABS_WRITE32(0, 0x12345678);
         EXPECT_ABS_READ32(0, 0x12345678);
         sec_mmio_write32(0, 0x12345678);
 
         EXPECT_ABS_READ32(0, 0);
         sec_mmio_check_values(/*rnd_offset=*/0);
-      }(),
+      },
       "");
 }
 
 TEST_F(SecMmioDeathTest, CheckCountWriteMismatch) {
   // The developer forgot to increment the write counter, or an attacker
   // glitched the sec write operation.
-  ASSERT_DEATH(
-      [] {
+  EXPECT_DEATH(
+      {
         EXPECT_ABS_WRITE32(0, 0x12345678);
         EXPECT_ABS_READ32(0, 0x12345678);
         sec_mmio_write32(0, 0x12345678);
         sec_mmio_check_counters(/*expected_check_count=*/0);
-      }(),
+      },
       "");
 }
 

sw/device/silicon_creator/lib/drivers/lifecycle_unittest.cc

@@ -124,7 +124,7 @@ class LifecycleDeathTest : public LifecycleTest,
                            public testing::WithParamInterface<uint32_t> {};
 
 TEST_P(LifecycleDeathTest, InvalidState) {
-  ASSERT_DEATH(
+  EXPECT_DEATH(
       {
         EXPECT_SEC_READ32(base_ + LC_CTRL_LC_STATE_REG_OFFSET, GetParam());
         lifecycle_state_get();

sw/device/silicon_creator/lib/shutdown_unittest.cc

@@ -560,7 +560,7 @@ TEST_F(ShutdownTest, InitializeManufacturing) {
 class ShutdownDeathTest : public ShutdownTest {};
 
 TEST_F(ShutdownDeathTest, InitializeInvalid) {
-  ASSERT_DEATH(
+  EXPECT_DEATH(
       {
         SetupOtpReads();
         shutdown_init(static_cast<lifecycle_state_t>(0));

sw/device/silicon_creator/lib/sigverify_unittest.cc

@@ -170,7 +170,7 @@ INSTANTIATE_TEST_SUITE_P(NonTestOperationalStates, SigverifyInNonTestStates,
 class SigverifyInNonTestStatesDeathTest : public SigverifyInLcState {};
 
 TEST_P(SigverifyInNonTestStatesDeathTest, BadOtpValue) {
-  ASSERT_DEATH(
+  EXPECT_DEATH(
       {
         EXPECT_CALL(
             otp_,
@@ -222,7 +222,7 @@ TEST_F(SigverifyInTestStates, BadSignatureIbex) {
 class SigverifyBadLcStateDeathTest : public SigverifyInLcState {};
 
 TEST_F(SigverifyBadLcStateDeathTest, BadLcState) {
-  ASSERT_DEATH(
+  EXPECT_DEATH(
       {
         uint32_t flash_exec = 0;
         sigverify_rsa_verify(&kSignature, &key_, &kTestDigest,

sw/device/silicon_creator/mask_rom/sigverify_keys_unittest.cc

@@ -180,7 +180,7 @@ TEST_P(BadKeyIdTypeDeathTest, BadKeyType) {
   };
   const sigverify_rsa_key_t *key;
 
-  ASSERT_DEATH(
+  EXPECT_DEATH(
       {
         ExpectKeysPtrGet(keys);
         sigverify_rsa_key_get(key_id, GetParam(), &key);
@@ -206,7 +206,7 @@ TEST_P(NonOperationalStateDeathTest, BadKey) {
   std::tie(key_index, lc_state) = GetParam();
   const sigverify_rsa_key_t *key;
 
-  ASSERT_DEATH(
+  EXPECT_DEATH(
       {
         ExpectKeysPtrGet(kMockKeys);
         sigverify_rsa_key_get(