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‎inbox-excel-vocabs/voc4cat.xlsx‎

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‎vocabularies/voc4cat/0007108.ttl‎

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PREFIX dcterms: <http://purl.org/dc/terms/>
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PREFIX skos: <http://www.w3.org/2004/02/skos/core#>
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PREFIX xsd: <http://www.w3.org/2001/XMLSchema#>
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<https://w3id.org/nfdi4cat/voc4cat_0007108>
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a skos:Concept ;
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dcterms:identifier "voc4cat_0007108"^^xsd:token ;
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skos:altLabel "primary energy; accelerating voltage; electron beam energy"@en ;
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skos:definition "The kinetic energy of the incident electron beam, typically measured in kiloelectronvolts (keV), which influences the interaction volume and excitation of X-rays in the sample."@en ;
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skos:historyNote "0000-0001-5886-7860 Hendrik Borgelt created this resource,"@en ;
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skos:inScheme <https://w3id.org/nfdi4cat/voc4cat> ;
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skos:prefLabel "beam energy"@en ;
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skos:topConceptOf <https://w3id.org/nfdi4cat/voc4cat> ;
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‎vocabularies/voc4cat/0007109.ttl‎

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PREFIX dcterms: <http://purl.org/dc/terms/>
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PREFIX skos: <http://www.w3.org/2004/02/skos/core#>
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PREFIX xsd: <http://www.w3.org/2001/XMLSchema#>
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<https://w3id.org/nfdi4cat/voc4cat_0007109>
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a skos:Concept ;
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dcterms:identifier "voc4cat_0007109"^^xsd:token ;
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skos:altLabel "tilt angle; sample tilt"@en ;
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skos:definition "The angle between the sample holder (stage) surface and the incident electron beam axis, used to optimize geometry for imaging or detection."@en ;
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skos:historyNote "0000-0001-5886-7860 Hendrik Borgelt created this resource,"@en ;
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skos:inScheme <https://w3id.org/nfdi4cat/voc4cat> ;
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skos:prefLabel "stage tilt"@en ;
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skos:topConceptOf <https://w3id.org/nfdi4cat/voc4cat> ;
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‎vocabularies/voc4cat/0007110.ttl‎

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PREFIX dcterms: <http://purl.org/dc/terms/>
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PREFIX skos: <http://www.w3.org/2004/02/skos/core#>
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PREFIX xsd: <http://www.w3.org/2001/XMLSchema#>
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<https://w3id.org/nfdi4cat/voc4cat_0007110>
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a skos:Concept ;
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dcterms:identifier "voc4cat_0007110"^^xsd:token ;
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skos:altLabel
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"beam emission angle"@en ,
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"take-off angle"@en ;
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skos:definition "The angle between the sample surface and the line-of-sight to a detector, which affects the path length and detection efficiency."@en ;
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skos:historyNote "0000-0001-5886-7860 Hendrik Borgelt created this resource,"@en ;
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skos:inScheme <https://w3id.org/nfdi4cat/voc4cat> ;
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skos:prefLabel "detector tilt angle"@en ;
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skos:topConceptOf <https://w3id.org/nfdi4cat/voc4cat> ;
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‎vocabularies/voc4cat/0007111.ttl‎

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PREFIX dcterms: <http://purl.org/dc/terms/>
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PREFIX skos: <http://www.w3.org/2004/02/skos/core#>
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PREFIX xsd: <http://www.w3.org/2001/XMLSchema#>
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<https://w3id.org/nfdi4cat/voc4cat_0007111>
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a skos:Concept ;
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dcterms:identifier "voc4cat_0007111"^^xsd:token ;
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skos:altLabel
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"azimuth angle"@en ,
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"in-plane rotation"@en ;
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skos:definition "The in-plane rotation angle of the specimen around the beam axis, used to align crystallographic directions or detector orientation relative to the sample."@en ;
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skos:historyNote "0000-0001-5886-7860 Hendrik Borgelt created this resource,"@en ;
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skos:inScheme <https://w3id.org/nfdi4cat/voc4cat> ;
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skos:prefLabel "sample azimuth angle"@en ;
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skos:topConceptOf <https://w3id.org/nfdi4cat/voc4cat> ;
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.

‎vocabularies/voc4cat/0007112.ttl‎

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PREFIX dcterms: <http://purl.org/dc/terms/>
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PREFIX skos: <http://www.w3.org/2004/02/skos/core#>
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PREFIX xsd: <http://www.w3.org/2001/XMLSchema#>
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<https://w3id.org/nfdi4cat/voc4cat_0007112>
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a skos:Concept ;
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dcterms:identifier "voc4cat_0007112"^^xsd:token ;
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skos:altLabel "real time; clock time; elapsed acquisition time"@en ;
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skos:definition "The total elapsed time during the data acquisition process, including both periods when the detector is actively collecting data and when it is not (due to dead time or processing delays)."@en ;
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skos:historyNote "0000-0001-5886-7860 Hendrik Borgelt created this resource,"@en ;
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skos:inScheme <https://w3id.org/nfdi4cat/voc4cat> ;
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skos:prefLabel "measurement reference time"@en ;
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skos:topConceptOf <https://w3id.org/nfdi4cat/voc4cat> ;
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.

‎vocabularies/voc4cat/0007113.ttl‎

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PREFIX dcterms: <http://purl.org/dc/terms/>
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PREFIX skos: <http://www.w3.org/2004/02/skos/core#>
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PREFIX xsd: <http://www.w3.org/2001/XMLSchema#>
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<https://w3id.org/nfdi4cat/voc4cat_0007113>
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a skos:Concept ;
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dcterms:identifier "voc4cat_0007113"^^xsd:token ;
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skos:altLabel "live time; effective counting time; life time"@en ;
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skos:definition "The net time during which the detector is actively recording, excluding time lost to processing (dead time)."@en ;
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skos:historyNote "0000-0001-5886-7860 Hendrik Borgelt created this resource,"@en ;
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skos:inScheme <https://w3id.org/nfdi4cat/voc4cat> ;
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skos:prefLabel "active acquisition time"@en ;
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skos:topConceptOf <https://w3id.org/nfdi4cat/voc4cat> ;
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‎vocabularies/voc4cat/0007114.ttl‎

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PREFIX dcterms: <http://purl.org/dc/terms/>
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PREFIX skos: <http://www.w3.org/2004/02/skos/core#>
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PREFIX xsd: <http://www.w3.org/2001/XMLSchema#>
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<https://w3id.org/nfdi4cat/voc4cat_0007114>
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a skos:Concept ;
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dcterms:identifier "voc4cat_0007114"^^xsd:token ;
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skos:definition "The classification of the energy-dispersive X-ray (EDX) detector based on its internal sensor technology, which determines characteristics such as energy resolution and count rate performance"@en ;
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skos:historyNote "0000-0001-5886-7860 Hendrik Borgelt created this resource,"@en ;
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skos:inScheme <https://w3id.org/nfdi4cat/voc4cat> ;
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skos:prefLabel "detector type"@en ;
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skos:topConceptOf <https://w3id.org/nfdi4cat/voc4cat> ;
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.

‎vocabularies/voc4cat/0007115.ttl‎

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PREFIX dcterms: <http://purl.org/dc/terms/>
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PREFIX skos: <http://www.w3.org/2004/02/skos/core#>
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PREFIX xsd: <http://www.w3.org/2001/XMLSchema#>
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<https://w3id.org/nfdi4cat/voc4cat_0007115>
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a skos:Concept ;
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dcterms:identifier "voc4cat_0007115"^^xsd:token ;
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skos:altLabel "Si dead layer; entrance dead layer; inactive detection surface region"@en ;
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skos:definition "A non-sensitive region at the surface of a detector, typically composed of silicon or other passive materials, in which incident rays of various kinds may be absorbed without generating a measurable signal. This layer reduces sensitivity."@en ;
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skos:historyNote "0000-0001-5886-7860 Hendrik Borgelt created this resource,"@en ;
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skos:inScheme <https://w3id.org/nfdi4cat/voc4cat> ;
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skos:prefLabel "detector window dead layer"@en ;
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skos:topConceptOf <https://w3id.org/nfdi4cat/voc4cat> ;
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‎vocabularies/voc4cat/0007116.ttl‎

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PREFIX dcterms: <http://purl.org/dc/terms/>
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PREFIX skos: <http://www.w3.org/2004/02/skos/core#>
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PREFIX xsd: <http://www.w3.org/2001/XMLSchema#>
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<https://w3id.org/nfdi4cat/voc4cat_0007116>
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a skos:Concept ;
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dcterms:identifier "voc4cat_0007116"^^xsd:token ;
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skos:altLabel "detector thickness; active layer thickness; detection depth"@en ;
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skos:definition "The physical thickness of the active region in a detector that is responsible for absorbing and converting incoming rays into charge carriers for signal generation."@en ;
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skos:historyNote "0000-0001-5886-7860 Hendrik Borgelt created this resource,"@en ;
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skos:inScheme <https://w3id.org/nfdi4cat/voc4cat> ;
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skos:prefLabel "detector excitation material thickness"@en ;
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skos:topConceptOf <https://w3id.org/nfdi4cat/voc4cat> ;
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