tests: bluetooth: ble_scan: add manufacturer data event handler tests

Add unit tests for the adv report event handler with the manufacturer
data filter, covering both filter match and no-match cases.

Signed-off-by: Martynas Smilingis <martynas.smilingis@nordicsemi.no>

Author: PizzaAllTheWay

tests/unit/lib/bluetooth/ble_scan/src/unity_test.c

@@ -1327,6 +1327,88 @@ void test_ble_scan_on_ble_evt_adv_report_device_uuid_connect(void)
 	TEST_ASSERT_EQUAL(BLE_SCAN_EVT_FILTER_MATCH, scan_event.evt_type);
 }
 
+void test_ble_scan_on_ble_evt_adv_report_device_manufacturer_data_not_found(void)
+{
+	/* Advertising packet does not contain manufacturer-specific data matching the configured
+	 * filter. The mocked find helper returns false, so the scan event handler must receive
+	 * BLE_SCAN_EVT_NOT_FOUND.
+	 */
+	uint8_t manuf_data_exp[2];
+	uint8_t dummy_data[] = "hello";
+	ble_evt_t ble_evt = {
+		.header.evt_id = BLE_GAP_EVT_ADV_REPORT,
+		.evt.gap_evt = {
+			.conn_handle = CONN_HANDLE,
+			.params.adv_report = {
+				.data = {
+					.p_data = dummy_data,
+					.len = sizeof(dummy_data),
+				},
+			},
+		},
+	};
+
+	/* Encode the company identifier in little-endian as required by the BLE spec. */
+	sys_put_le16(BLE_COMPANY_ID_NORDIC, manuf_data_exp);
+
+	test_ble_scan_filter_add_manufacturer_data();
+
+	__cmock_ble_adv_data_manufacturer_data_find_ExpectWithArrayAndReturn(
+		ble_evt.evt.gap_evt.params.adv_report.data.p_data, 1,
+		ble_evt.evt.gap_evt.params.adv_report.data.len,
+		manuf_data_exp, sizeof(manuf_data_exp), sizeof(manuf_data_exp),
+		false); /* Mock "no manufacturer data match" -> expect BLE_SCAN_EVT_NOT_FOUND */
+	__cmock_sd_ble_gap_scan_start_ExpectAndReturn(NULL, &ble_scan.scan_buffer, NRF_SUCCESS);
+
+	ble_evt_send(&ble_evt);
+	TEST_ASSERT_EQUAL(BLE_SCAN_EVT_NOT_FOUND, scan_event.evt_type);
+}
+
+void test_ble_scan_on_ble_evt_adv_report_device_manufacturer_data(void)
+{
+	/* Advertising packet contains manufacturer-specific data matching the configured filter.
+	 * The mocked find helper returns true, so the scan event handler must receive
+	 * BLE_SCAN_EVT_FILTER_MATCH with only manufacturer_data_filter_match set.
+	 */
+	uint8_t manuf_data_exp[2];
+	uint8_t dummy_data[] = "hello";
+	ble_evt_t ble_evt = {
+		.header.evt_id = BLE_GAP_EVT_ADV_REPORT,
+		.evt.gap_evt = {
+			.conn_handle = CONN_HANDLE,
+			.params.adv_report = {
+				.data = {
+					.p_data = dummy_data,
+					.len = sizeof(dummy_data),
+				},
+			},
+		},
+	};
+
+	/* Encode the company identifier in little-endian as required by the BLE spec. */
+	sys_put_le16(BLE_COMPANY_ID_NORDIC, manuf_data_exp);
+
+	test_ble_scan_filter_add_manufacturer_data();
+
+	__cmock_ble_adv_data_manufacturer_data_find_ExpectWithArrayAndReturn(
+		ble_evt.evt.gap_evt.params.adv_report.data.p_data, 1,
+		ble_evt.evt.gap_evt.params.adv_report.data.len,
+		manuf_data_exp, sizeof(manuf_data_exp), sizeof(manuf_data_exp),
+		true); /* Mock "manufacturer data match" -> expect BLE_SCAN_EVT_FILTER_MATCH */
+	__cmock_sd_ble_gap_scan_start_ExpectAndReturn(NULL, &ble_scan.scan_buffer, NRF_SUCCESS);
+
+	ble_evt_send(&ble_evt);
+	TEST_ASSERT_EQUAL(BLE_SCAN_EVT_FILTER_MATCH, scan_event.evt_type);
+	TEST_ASSERT_EQUAL(0, scan_event.filter_match.filter_match.address_filter_match);
+	TEST_ASSERT_EQUAL(0, scan_event.filter_match.filter_match.name_filter_match);
+	TEST_ASSERT_EQUAL(0, scan_event.filter_match.filter_match.short_name_filter_match);
+	TEST_ASSERT_EQUAL(0, scan_event.filter_match.filter_match.appearance_filter_match);
+	TEST_ASSERT_EQUAL(0, scan_event.filter_match.filter_match.uuid_filter_match);
+	TEST_ASSERT_EQUAL(1, scan_event.filter_match.filter_match.manufacturer_data_filter_match);
+	TEST_ASSERT_EQUAL_PTR(&ble_evt.evt.gap_evt.params.adv_report,
+			      scan_event.filter_match.adv_report);
+}
+
 void test_ble_scan_on_ble_evt_timeout(void)
 {
 	ble_evt_t ble_evt = {