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Add a note about edge sources
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docs/jwst/adaptive_trace_model/main.rst

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@@ -93,6 +93,10 @@ Slope values higher than a threshold value (step parameter ``slope_limit``) indi
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a compact source region. The trace model will be evaluated for these regions, with some
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padding for nearby pixels; it will not be evaluated in other regions.
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For MOS and fixed slit data, note that the model accuracy also depends on the position of the
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source within the spectral region. Sources on the edge of a MOS slitlet, for example,
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may not be well modeled by the spline fits, even if they are bright and compact.
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If no oversampling is desired (i.e., the ``oversample`` parameter is set to 1.0), then the trace
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model is evaluated at every input pixel in a compact source region to create a wavelength-dependent
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spatial profile. This image is stored in the output datamodel, in the ``trace_model`` attribute.

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