Is your feature request related to a problem? Please describe.
Very difficult to program new features to recalculate gate resistor etc. in every single exporter or every single self-written program
Describe the solution you'd like
Improvement for handling interpolating other data:
- Pre-fill a multidimensional matrix for e_on/e_off/e_rr and channel-characteristics curves
- This matrix will be interpolated once
- This data can be more easily used to compare transistors
- This data can be more easily used to make new calculations for usage in own programs
- This data can be more easily used to export to other programs
Is your feature request related to a problem? Please describe.
Very difficult to program new features to recalculate gate resistor etc. in every single exporter or every single self-written program
Describe the solution you'd like
Improvement for handling interpolating other data: