v4.2.0-5621-g24790c965ece: stm32 results

[djiatsaf-st]

Non reg result analysis on last run:

Failed tests:
(verdicts: T/p: Passed, F/f: Failed, t:timeout)
samples/arch/mpu/mpu_test/sample.mpu.mpu_test, b_u585i_iot02a/stm32u585xx
samples/arch/mpu/mpu_test/sample.mpu.mpu_test, nucleo_c071rb/stm32c071xx
samples/arch/mpu/mpu_test/sample.mpu.mpu_test, nucleo_g071rb/stm32g071xx
samples/arch/mpu/mpu_test/sample.mpu.mpu_test, nucleo_l073rz/stm32l073xx
samples/arch/mpu/mpu_test/sample.mpu.mpu_test, nucleo_u385rg_q/stm32u385xx
samples/arch/mpu/mpu_test/sample.mpu.mpu_test, nucleo_wba55cg/stm32wba55xx
samples/arch/mpu/mpu_test/sample.mpu.mpu_test, stm32h573i_dk/stm32h573xx
samples/arch/mpu/mpu_test/sample.mpu.mpu_test, stm32h7s78_dk/stm32h7s7xx
samples/arch/mpu/mpu_test/sample.mpu.mpu_test, stm32n6570_dk/stm32n657xx/sb
samples/arch/mpu/mpu_test/sample.mpu.mpu_test, stm32u083c_dk/stm32u083xx
samples/drivers/adc/adc_sequence/sample.drivers.adc.adc_sequence, stm32f3_disco@B/stm32f303xc
samples/drivers/counter/alarm/sample.drivers.counter.alarm.stm32_rtc, nucleo_f103rb/stm32f103xb
samples/drivers/spi_flash/sample.drivers.spi.flash, stm32n6570_dk/stm32n657xx/sb
samples/kernel/condition_variables/condvar/sample.kernel.cond_var, nucleo_f103rb/stm32f103xb
samples/kernel/msg_queue/sample.kernel.msgqueue, nucleo_f103rb/stm32f103xb
samples/psa/its/sample.psa.its.secure_storage.entropy_driver, nucleo_h753zi/stm32h753xx
samples/psa/its/sample.psa.its.secure_storage.entropy_driver, stm32h7s78_dk/stm32h7s7xx
samples/psa/its/sample.psa.its.secure_storage.entropy_not_secure, stm32n6570_dk/stm32n657xx/sb
samples/psa/persistent_key/sample.psa.persistent_key.secure_storage.entropy_driver, nucleo_h753zi/stm32h753xx
samples/psa/persistent_key/sample.psa.persistent_key.secure_storage.entropy_not_secure, stm32n6570_dk/stm32n657xx/sb
samples/sensor/die_temp_polling/sample.sensor.die_temperature_polling, b_u585i_iot02a/stm32u585xx
samples/sensor/die_temp_polling/sample.sensor.die_temperature_polling, disco_l475_iot1/stm32l475xx
samples/sensor/die_temp_polling/sample.sensor.die_temperature_polling, nucleo_g071rb/stm32g071xx
samples/sensor/die_temp_polling/sample.sensor.die_temperature_polling, nucleo_g474re/stm32g474xx
samples/sensor/die_temp_polling/sample.sensor.die_temperature_polling, nucleo_h753zi/stm32h753xx
samples/sensor/die_temp_polling/sample.sensor.die_temperature_polling, nucleo_wb55rg/stm32wb55xx
samples/sensor/die_temp_polling/sample.sensor.die_temperature_polling, nucleo_wl55jc/stm32wl55xx
samples/sensor/die_temp_polling/sample.sensor.die_temperature_polling, stm32h7s78_dk/stm32h7s7xx
samples/sensor/hts221/sample.sensor.hts221, b_u585i_iot02a/stm32u585xx
samples/sensor/sensor_shell/sample.sensor.shell.pytest, b_u585i_iot02a/stm32u585xx
samples/sensor/sensor_shell/sample.sensor.shell.pytest, nucleo_wl55jc/stm32wl55xx
samples/sensor/soc_voltage/sample.sensor.soc_voltage, b_u585i_iot02a/stm32u585xx
samples/sensor/soc_voltage/sample.sensor.soc_voltage, nucleo_g071rb/stm32g071xx
samples/sensor/soc_voltage/sample.sensor.soc_voltage, nucleo_wl55jc/stm32wl55xx
samples/sensor/soc_voltage/sample.sensor.soc_voltage, stm32h7s78_dk/stm32h7s7xx
samples/subsys/logging/logger/sample.logger.basic, nucleo_f103rb/stm32f103xb (instable: pfppfffppppppppffppfpfpfpepppepeepepe)
samples/subsys/tracing/sample.tracing.gpio, nucleo_f103rb/stm32f103xb
samples/subsys/tracing/sample.tracing.user, nucleo_f103rb/stm32f103xb (instable: pppfpppfpppppppfpppfpppppppeppppppppe)
samples/subsys/zbus/confirmed_channel/sample.zbus.confirmed_message, nucleo_f103rb/stm32f103xb
samples/subsys/zbus/dyn_channel/sample.zbus.dyn_channel, nucleo_f103rb/stm32f103xb
samples/subsys/zbus/hello_world/sample.zbus.hello_world, nucleo_f103rb/stm32f103xb
samples/subsys/zbus/runtime_obs_registration/sample.zbus.runtime_os_registration, nucleo_f103rb/stm32f103xb
samples/subsys/zbus/runtime_obs_registration/sample.zbus.runtime_os_registration_dynamic_alloc, nucleo_f103rb/stm32f103xb
samples/subsys/zbus/work_queue/sample.zbus.work_queue, nucleo_f103rb/stm32f103xb (instable: pfpfpfffffpfpppfpfffpppppeeppeppppppp)
tests/application_development/ram_context_for_isr/application_development.ram_context_for_isr, stm32n6570_dk/stm32n657xx/sb
tests/boot/test_mcuboot/bootloader.mcuboot.assert, b_u585i_iot02a/stm32u585xx
tests/boot/with_mcumgr/boot.with_mcumgr.test_upgrade.swap_using_offset, nucleo_wba55cg/stm32wba55xx
tests/drivers/adc/adc_api/drivers.adc, nucleo_g071rb/stm32g071xx
tests/drivers/adc/adc_api/drivers.adc, nucleo_h753zi/stm32h753xx
tests/drivers/adc/adc_api/drivers.adc, nucleo_wl55jc/stm32wl55xx
tests/drivers/adc/adc_api/drivers.adc.dma_st_stm32, b_u585i_iot02a/stm32u585xx
tests/drivers/adc/adc_api/drivers.adc.dma_st_stm32, nucleo_g071rb/stm32g071xx
tests/drivers/adc/adc_api/drivers.adc.dma_st_stm32, nucleo_h753zi/stm32h753xx
tests/drivers/adc/adc_api/drivers.adc.dma_st_stm32, nucleo_wl55jc/stm32wl55xx
tests/drivers/counter/counter_basic_api/drivers.counter.basic_api, nucleo_c071rb/stm32c071xx
tests/drivers/dac/dac_loopback/drivers.dac.loopback, nucleo_g071rb/stm32g071xx
tests/drivers/dac/dac_loopback/drivers.dac.loopback, nucleo_wl55jc/stm32wl55xx
tests/drivers/disk/disk_access/drivers.disk.stm32_sdhc, stm32n6570_dk/stm32n657xx/sb
tests/drivers/flash/common/drivers.flash.common.default, nucleo_h753zi/stm32h753xx
tests/drivers/flash/common/drivers.flash.common.default, nucleo_wb55rg/stm32wb55xx
tests/drivers/flash/common/drivers.flash.common.stm32, nucleo_h753zi/stm32h753xx
tests/drivers/flash/common/drivers.flash.common.test_storage_partition, nucleo_h753zi/stm32h753xx
tests/drivers/flash/common/drivers.flash.common.test_storage_partition, nucleo_wb55rg/stm32wb55xx
tests/drivers/flash/stm32/drivers.flash.stm32.h7, nucleo_h753zi/stm32h753xx
tests/drivers/flash/stm32/drivers.flash.stm32.h7.block_registers, nucleo_h753zi/stm32h753xx
tests/drivers/gpio/gpio_api_1pin/drivers.gpio.1pin, stm32n6570_dk/stm32n657xx/sb
tests/drivers/hwinfo/api/drivers.hwinfo.api, stm32h7s78_dk/stm32h7s7xx
tests/drivers/input/tsc_keys/drivers.input.stm32_tsc, stm32u083c_dk/stm32u083xx
tests/drivers/memc/ram/drivers.memc, stm32h7s78_dk/stm32h7s7xx
tests/drivers/udc/drivers.usb.udc, stm32n6570_dk/stm32n657xx/sb
tests/kernel/mem_protect/protection/kernel.memory_protection.protection, stm32n6570_dk/stm32n657xx/sb
tests/lib/cmsis_dsp/transform/libraries.cmsis_dsp.transform.cq31, stm32n6570_dk/stm32n657xx/sb
tests/lib/cmsis_dsp/transform/libraries.cmsis_dsp.transform.rq31.fpu, stm32n6570_dk/stm32n657xx/sb
tests/lib/cpp/cxx/cpp.main.minimal, nucleo_wba55cg/stm32wba55xx
tests/lib/cpp/cxx/cpp.main.newlib, nucleo_wba55cg/stm32wba55xx
tests/lib/cpp/cxx/cpp.main.newlib_nano, nucleo_wba55cg/stm32wba55xx
tests/lib/cpp/cxx/cpp.main.picolibc, nucleo_wba55cg/stm32wba55xx
tests/lib/devicetree/api_ext/libraries.devicetree.api_ext, b_u585i_iot02a/stm32u585xx
tests/lib/devicetree/api_ext/libraries.devicetree.api_ext, nucleo_g071rb/stm32g071xx
tests/lib/devicetree/api_ext/libraries.devicetree.api_ext, nucleo_wl55jc/stm32wl55xx
tests/lib/hash_function/libraries.hash_function.djb2, stm32h7s78_dk/stm32h7s7xx (Regression)
tests/lib/spsc_pbuf/libraries.spsc_pbuf, nucleo_f746zg/stm32f746xx
tests/subsys/debug/cpu_load/debug.cpu_load, nucleo_g474re/stm32g474xx
tests/subsys/debug/cpu_load/debug.cpu_load.periodic_report, nucleo_g474re/stm32g474xx
tests/subsys/debug/cpu_load/debug.cpu_load.periodic_report, nucleo_l152re/stm32l152xe
tests/subsys/rtio/workq/rtio.workq, stm32h7s78_dk/stm32h7s7xx (Regression)
tests/subsys/secure_storage/psa/crypto/secure_storage.psa.crypto.secure_storage, nucleo_h753zi/stm32h753xx
tests/subsys/secure_storage/psa/crypto/secure_storage.psa.crypto.secure_storage, stm32n6570_dk/stm32n657xx/sb
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.custom.store, stm32h7s78_dk/stm32h7s7xx
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.custom.transform, disco_l475_iot1/stm32l475xx (Regression)
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.custom.transform, nucleo_f103rb/stm32f103xb (instable: pppppppppppppppppppfppppppppppppppppp)
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.custom.transform, nucleo_g474re/stm32g474xx (Regression)
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.custom.transform, nucleo_h753zi/stm32h753xx
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.custom.transform, nucleo_l152re/stm32l152xe
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.custom.transform, nucleo_wb55rg/stm32wb55xx (Regression)
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.custom.transform, nucleo_wba55cg/stm32wba55xx (Regression)
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.custom.transform, stm32h7s78_dk/stm32h7s7xx
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.custom.transform, stm32n6570_dk/stm32n657xx/sb
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.store.settings, nucleo_h753zi/stm32h753xx
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.store.settings, nucleo_l152re/stm32l152xe
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.store.settings, stm32n6570_dk/stm32n657xx/sb
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.store.settings.64-bit_uids, nucleo_g474re/stm32g474xx (Regression)
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.store.settings.64-bit_uids, nucleo_h753zi/stm32h753xx
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.store.settings.64-bit_uids, nucleo_l152re/stm32l152xe
tests/subsys/secure_storage/psa/its/secure_storage.psa.its.secure_storage.store.settings.64-bit_uids, stm32n6570_dk/stm32n657xx/sb
tests/subsys/usb/device/usb.device, stm32n6570_dk/stm32n657xx/sb

Total: 11269 tests run
106 test(s) failed on stable test
7 regression(s) on stable test
11163 test(s) passed
Recently skipped or filtered: 0